Solutions

Probe Cards

Probe Card

Cantilever technology

  • Standard, Multi-die, Multi-square, Fine Pitch, RF Epoxy
  • Windowless ®
  • CantImager ®
  • XXL ®

Vertical Technology

  • VERTI B ®: Microspring
  • VERTI P ®: Microspring
  • M60 ®: Mems
  • VERTI T78 ®: Buckling Beams
  • VERTI T78B ®: Buckling Beams

Parametric Probe Cards

  • Parametric Blade
  • Parametric Epoxy